Abstract

Return to:

Subject Index
Author Index
Keyword Search

Atomic Force Microscopy: Micro- and Nano-Mapping of Adhesion, Tack and Viscosity

A. Döring, University of Ulm Dept. Exp. Physics, Ulm, Germany

J. Stahr and S. Zöllner
Beiersdorf AG, Hamburg, Research and Development
tesa
Hamburg, Germany

Atomic Force Microscopy (AFM) is shown to be a powerful analytical tool in research and quality assurance of the pressure sensitive adhesive (PSA) tape industry. AFM gives a three-dimensional topographic image of a surface and, moreover, can "feel" and scan certain polymeric material properties, such as hardness and adhesion properties with a resolution in nanoscales (< 5 nm). Basics of AFM are briefly described and the effective use of AFM in the evaluation of PSAs is demonstrated. Examples of detected polymer-resin inhomogeneities, morphology of polymer blends, identification of polymer phases, phase distribution between PSA bulk and surface, and correlation with PSA "macro"-properties, such as probe tack, are given.